A deep analysis of SEU consequences in the internal memory of LEON3 processor

RAMOS VARGAS, PABLO FRANCISCO

dc.contributor.author	RAMOS VARGAS, PABLO FRANCISCO
dc.date.accessioned	2019-05-14T00:30:03Z
dc.date.available	2019-05-14T00:30:03Z
dc.date.issued	2016-04-08
dc.identifier.idautor	1712447976
dc.identifier.uri	2016-UGI-167
dc.identifier.uri	http://repositorio.espe.edu.ec/handle/21000/19233
dc.description.sponsorship	General Chairs: Letícia Bolzani Poehls - PUCRS, Brazil. Yervant Zorian - Synopsys, USA. Past General Chair: Víctor Champac - INAOE, Mexico. Local Chair: Andre Mariano - UFPR, Brazil. Honorary Chair: Fabian Vargas - PUCRS, Brazil. Program Chairs: Matteo Sonza Reorda - Politecnico di Torino, Italy. Tiago Balen - UFRGS, Brazil. Special Session Chair: Vishwani Agrawal - Auburn University, USA. Panel Chairs: Raoul Velazco - TIMA Laboratories, France. Fernanda Kastensmidt - UFRGS, Brasil. Publication Chairs: Maksim Jenihhin - Tallinn University of Technology, Estonia.
dc.publisher	IEEE Sección América Latina.
dc.rights	openAccess
dc.source	2016 17th Latin-American Test Symposium (LATS)
dc.title	A deep analysis of SEU consequences in the internal memory of LEON3 processor
dc.type	conferenceObject