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SINGLE EVENTS IN A COTS SOFT-ERROR FREE SRAM AT LOW BIAS VOLTAGE INDUCED BY 15-MEV NEUTRONS

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dc.contributor.author VARGAS VALLEJO, VANESSA CAROLINA
dc.contributor.author RAMOS VARGAS, PABLO FRANCISCO
dc.date.accessioned 2019-05-14T00:38:29Z
dc.date.available 2019-05-14T00:38:29Z
dc.date.issued 2016-07-12
dc.identifier.idautor 1711309045
dc.identifier.idautor 1712447976
dc.identifier.issn 0018-9499
dc.identifier.uri http://dx.doi.org/10.1109/TNS.2016.2522819
dc.identifier.uri https://ieeexplore.ieee.org/document/7508896/
dc.identifier.uri http://repositorio.espe.edu.ec/handle/21000/20211
dc.publisher IEEE TRANSACTIONS ON NUCLEAR SCIENCE
dc.relation.ispartof IEEE TRANSACTIONS ON NUCLEAR SCIENCE, volumen 63
dc.rights openAccess
dc.title SINGLE EVENTS IN A COTS SOFT-ERROR FREE SRAM AT LOW BIAS VOLTAGE INDUCED BY 15-MEV NEUTRONS
dc.type Artículo


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